Assignee
PROMETRIX CORP
US·18 granted patents·1 pending application·2,277 citations·filing 1985–2003
Top patents by PatentIndex Score
19 records- 0199US5486701AMethod and apparatus for measuring reflectance in two wavelength bands to enable determination of thin film thicknessPROMETRIX CORP·Filed 1994·Granted Jan 23, 1996·500 cites·42 claims
- 0295US4967381AProcess control interface system for managing measurement dataPROMETRIX CORP·Filed 1989·Granted Oct 30, 1990·207 cites·15 claims
- 0395US4873623AProcess control interface with simultaneously displayed three level dynamic menuPROMETRIX CORP·Filed 1987·Granted Oct 10, 1989·303 cites·6 claims
- 0493US5226118AData analysis system and method for industrial process control systemsPROMETRIX CORP·Filed 1991·Granted Jul 6, 1993·283 cites·28 claims
- 0592US4755746AApparatus and methods for semiconductor wafer testingPROMETRIX CORP·Filed 1985·Granted Jul 5, 1988·187 cites·21 claims
- 0691US5067805AConfocal scanning optical microscopePROMETRIX CORP·Filed 1990·Granted Nov 26, 1991·123 cites·22 claims
- 0791US4945220AAutofocusing system for microscope having contrast detection meansPROMETRIX CORP·Filed 1988·Granted Jul 31, 1990·102 cites·27 claims
- 0891US4843538AMulti-level dynamic menu which suppresses display of items previously designated as non-selectablePROMETRIX CORP·Filed 1988·Granted Jun 27, 1989·142 cites·9 claims
- 0990US4679137AProcess control interface system for designer and operatorPROMETRIX CORP·Filed 1985·Granted Jul 7, 1987·83 cites·32 claims
- 1082US4703252AApparatus and methods for resistivity testingPROMETRIX CORP·Filed 1985·Granted Oct 27, 1987·42 cites·12 claims
- 1181US4805089AProcess control interface system for managing measurement dataPROMETRIX CORP·Filed 1986·Granted Feb 14, 1989·74 cites·12 claims
- 1278US4776695AHigh accuracy film thickness measurement systemPROMETRIX CORP·Filed 1986·Granted Oct 11, 1988·41 cites·13 claims
- 1375US5386317AMethod and apparatus for imaging dense linewidth features using an optical microscopePROMETRIX CORP·Filed 1992·Granted Jan 31, 1995·46 cites·26 claims
- 1475US5260668ASemiconductor surface resistivity probe with semiconductor temperature controlPROMETRIX CORP·Filed 1992·Granted Nov 9, 1993·46 cites·9 claims
- 1575US4951190AMultilevel menu and hierarchy for selecting items and performing tasks thereon in a computer systemPROMETRIX CORP·Filed 1989·Granted Aug 21, 1990·35 cites·10 claims
- 1670US4907931AApparatus for handling semiconductor wafersPROMETRIX CORP·Filed 1988·Granted Mar 13, 1990·43 cites·32 claims
- 1761USD432159SCoin counting and sorting apparatusPROMETRIX CORP·Filed 1999·Granted Oct 17, 2000·11 cites·1 claims
- 1859USD292979SAutomatic semiconductor wafer testerPROMETRIX CORP·Filed 1985·Granted Dec 1, 1987·9 cites·1 claims
- 1940US2005057126A1Modular security enclosure for gaming machinePROMETRIX CORP·Filed 2003·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →