Assignee
PSIA CORP
KR4 patents
Top patents by PatentIndex Score
US6951129B2Oct 4, 2005
Scanning probe microscope with improved probe head mount
PSIA CORP18 citations91
US6945100B2Sep 20, 2005
Scanning probe microscope with improved probe tip mount
PSIA CORP20 citations91
US6185991B1Feb 13, 2001
Method and apparatus for measuring mechanical and electrical characteristics of a surface using electrostatic force modulation microscopy which operates in contact mode
PSIA CORP80 citations91
US6677567B2Jan 13, 2004
Scanning probe microscope with improved scan accuracy, scan speed, and optical vision
PSIA CORP20 citations90