Assignee
QC OPTICS INC
US·13 granted patents·624 citations·filing 1984–2000
Top patents by PatentIndex Score
13 records- 0192US4794265ASurface pit detection system and methodQC OPTICS INC·Filed 1987·Granted Dec 27, 1988·110 cites·21 claims
- 0289US6603542B1High sensitivity optical inspection system and method for detecting flaws on a diffractive surfaceQC OPTICS INC·Filed 2000·Granted Aug 5, 2003·64 cites·54 claims
- 0389US4794264ASurface defect detection and confirmation system and methodQC OPTICS INC·Filed 1987·Granted Dec 27, 1988·89 cites·17 claims
- 0486US5610719ADisplacement detection systemQC OPTICS INC·Filed 1995·Granted Mar 11, 1997·77 cites·19 claims
- 0583US5389794ASurface pit and mound detection and discrimination system and methodQC OPTICS INC·Filed 1992·Granted Feb 14, 1995·68 cites·20 claims
- 0680US5625193AOptical inspection system and method for detecting flaws on a diffractive surfaceQC OPTICS INC·Filed 1995·Granted Apr 29, 1997·63 cites·41 claims
- 0779US5672885ASurface displacement detection and adjustment systemQC OPTICS INC·Filed 1995·Granted Sep 30, 1997·57 cites·25 claims
- 0868US5717198APellicle reflectivity monitoring system having means for compensating for portions of light reflected by the pellicleQC OPTICS INC·Filed 1995·Granted Feb 10, 1998·34 cites·25 claims
- 0959US5814829AMultistation surface inspection systemQC OPTICS INC·Filed 1995·Granted Sep 29, 1998·23 cites·18 claims
- 1056US4943734AInspection apparatus and method for detecting flaws on a diffractive surfaceQC OPTICS INC·Filed 1989·Granted Jul 24, 1990·19 cites·16 claims
- 1144US4772127ASurface inspection apparatusQC OPTICS INC·Filed 1984·Granted Sep 20, 1988·9 cites·8 claims
- 1243US5602401AData processing system and method for a surface inspection apparatusQC OPTICS INC·Filed 1995·Granted Feb 11, 1997·11 cites·14 claims
- 1328US5675409APlate holder for a surface inspection systemQC OPTICS INC·Filed 1995·Granted Oct 7, 1997·0 cites·12 claims
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