Assignee
QUALITY SEMICONDUCTOR INC
US·13 granted patents·967 citations·filing 1991–1997
Top patents by PatentIndex Score
13 records- 0198US5289062AFast transmission gate switchQUALITY SEMICONDUCTOR INC·Filed 1993·Granted Feb 22, 1994·156 cites·6 claims
- 0292US5706224AContent addressable memory and random access memory partition circuitQUALITY SEMICONDUCTOR INC·Filed 1996·Granted Jan 6, 1998·293 cites·11 claims
- 0389US5367187AMaster slice gate array integrated circuits with basic cells adaptable for both input/output and logic functionsQUALITY SEMICONDUCTOR INC·Filed 1992·Granted Nov 22, 1994·152 cites·23 claims
- 0486US5964857APriority encoder for a content addressable memory systemQUALITY SEMICONDUCTOR INC·Filed 1997·Granted Oct 12, 1999·76 cites·22 claims
- 0586US5852569AContent addressable memory multiple match detection circuitQUALITY SEMICONDUCTOR INC·Filed 1997·Granted Dec 22, 1998·76 cites·17 claims
- 0680US5844425ACMOS tristate output buffer with having overvoltage protection and increased stability against bus voltage variationsQUALITY SEMICONDUCTOR INC·Filed 1996·Granted Dec 1, 1998·55 cites·49 claims
- 0765US5311475AHigh speed full and empty flag generators for first-in first-out memoryQUALITY SEMICONDUCTOR INC·Filed 1991·Granted May 10, 1994·43 cites·13 claims
- 0862US5223456AHigh density local interconnect in an integrated circit using metal silicideQUALITY SEMICONDUCTOR INC·Filed 1992·Granted Jun 29, 1993·37 cites·13 claims
- 0959US5828233AMixed mode CMOS input buffer with bus holdQUALITY SEMICONDUCTOR INC·Filed 1996·Granted Oct 27, 1998·17 cites·19 claims
- 1059US5228002AFirst-in first-out memory device and method for accessing the deviceQUALITY SEMICONDUCTOR INC·Filed 1991·Granted Jul 13, 1993·34 cites·19 claims
- 1152US5673277AScan test circuit using fast transmission gate switchQUALITY SEMICONDUCTOR INC·Filed 1996·Granted Sep 30, 1997·18 cites·10 claims
- 1237US5892406AMixed signal phase locked loop with process and temperature calibrationQUALITY SEMICONDUCTOR INC·Filed 1996·Granted Apr 6, 1999·7 cites·18 claims
- 1327US5254874AHigh density local interconnect in a semiconductor circuit using metal silicideQUALITY SEMICONDUCTOR INC·Filed 1991·Granted Oct 19, 1993·3 cites·15 claims
Join the waitlist — get patent alerts
Get an alert when QUALITY SEMICONDUCTOR INC files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →