Assignee

Qu wei feng

JP·2 granted patents·1 citations·filing 2012–2012

Technology mixH01L2 H10P2 C30B1 G01N1 H10D1

Top patents by PatentIndex Score

2 records

0168US8916953B2Method for manufacturing silicon single crystal wafer and annealed waferQu wei feng·Filed 2012·Granted Dec 23, 2014·1 cites·8 claims
0236US9606030B2Method for detecting crystal defectsQu wei feng·Filed 2012·Granted Mar 28, 2017·0 cites·8 claims

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