Assignee
RATHEI DIETER
4 granted patents·1 pending application·18 citations·filing 2000–2006
Top patents by PatentIndex Score
5 records- 0162US7587292B2Method of monitoring a semiconductor manufacturing trendRATHEI DIETER·Filed 2006·Granted Sep 8, 2009·4 cites·20 claims
- 0262US7524683B2Method of monitoring a semiconductor manufacturing trendRATHEI DIETER·Filed 2006·Granted Apr 28, 2009·2 cites·20 claims
- 0361US6963813B1Method and apparatus for fast automated failure classification for semiconductor wafersRATHEI DIETER·Filed 2000·Granted Nov 8, 2005·9 cites·15 claims
- 0460US7496478B2Method of monitoring a semiconductor manufacturing trendRATHEI DIETER·Filed 2006·Granted Feb 24, 2009·3 cites·25 claims
- 0535US2007016321A1Method for screening risk quality semiconductor productsRATHEI DIETER·Filed 2006·Application pending·0 cites
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