Assignee
RAYTEX CORP
US·4 granted patents·1 pending application·30 citations·filing 2003–2007
Top patents by PatentIndex Score
5 records- 0183US6798503B2Edge flaw inspection deviceRAYTEX CORP·Filed 2003·Granted Sep 28, 2004·24 cites·6 claims
- 0271US7616300B2Edge flaw detection deviceRAYTEX CORP·Filed 2005·Granted Nov 10, 2009·6 cites·4 claims
- 0343US7633617B2Defective particle measuring apparatus and defective particle measuring methodRAYTEX CORP·Filed 2006·Granted Dec 15, 2009·0 cites·12 claims
- 0437US2009201495A1Calibration Method For Edge Inspection ApparatusRAYTEX CORP·Filed 2007·Application pending·0 cites
- 0527US7255719B2Wafer rotation device and edge flaw inspection apparataus having the deviceRAYTEX CORP·Filed 2003·Granted Aug 14, 2007·0 cites·7 claims
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