Assignee
RAYTEX CORP
US4 patents
Top patents by PatentIndex Score
US6798503B2Sep 28, 2004
Edge flaw inspection device
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Edge flaw detection device
RAYTEX CORP6 citations53
US7633617B2Dec 15, 2009
Defective particle measuring apparatus and defective particle measuring method
RAYTEX CORP0 citations51
US7255719B2Aug 14, 2007
Wafer rotation device and edge flaw inspection apparataus having the device
RAYTEX CORP0 citations19