Assignee
REAL TIME METROLOGY INC
US·2 granted patents·280 citations·filing 2001–2003
Technology mixG01N2
Top patents by PatentIndex Score
2 records- 0196US6630996B2Optical method and apparatus for inspecting large area planar objectsREAL TIME METROLOGY INC·Filed 2001·Granted Oct 7, 2003·161 cites·52 claims
- 0295US6809809B2Optical method and apparatus for inspecting large area planar objectsREAL TIME METROLOGY INC·Filed 2003·Granted Oct 26, 2004·119 cites·15 claims
Join the waitlist — get patent alerts
Get an alert when REAL TIME METROLOGY INC files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →