Assignee
RENESAS ELECTRIC CORP
JP·2 granted patents·0 citations·filing 2012–2015
Top patents by PatentIndex Score
2 records- 0145US10281525B2Semiconductor device and diagnostic test method for both single-point and latent faults using first and second scan testsRENESAS ELECTRIC CORP·Filed 2015·Granted May 7, 2019·0 cites·20 claims
- 0243US8629002B2Manufacturing method of semiconductor deviceRENESAS ELECTRIC CORP·Filed 2012·Granted Jan 14, 2014·0 cites·5 claims
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