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REVERA INC
US14 patents
Top patents by PatentIndex Score
US6891158B2May 10, 2005
Nondestructive characterization of thin films based on acquired spectrum
REVERA INC62 citations94
US6800852B2Oct 5, 2004
Nondestructive characterization of thin films using measured basis spectra
REVERA INC72 citations94
US7884321B2Feb 8, 2011
Method and system for non-destructive distribution profiling of an element in a film
REVERA INC10 citations91
US7420163B2Sep 2, 2008
Determining layer thickness using photoelectron spectroscopy
REVERA INC21 citations90
US7411188B2Aug 12, 2008
Method and system for non-destructive distribution profiling of an element in a film
REVERA INC24 citations89
US7359487B1Apr 15, 2008
Diamond anode
REVERA INC66 citations87
US7456399B1Nov 25, 2008
Calibrating multiple photoelectron spectroscopy systems
REVERA INC20 citations79
US7449682B2Nov 11, 2008
System and method for depth profiling and characterization of thin films
REVERA INC8 citations71
US7561438B1Jul 14, 2009
Electronic device incorporating a multilayered capacitor formed on a printed circuit board
REVERA INC8 citations68
US7231324B2Jun 12, 2007
Techniques for analyzing data generated by instruments
REVERA INC8 citations67
US7720631B2May 18, 2010
Semiconductor substrate processing method and apparatus
REVERA INC6 citations65
US8011830B2Sep 6, 2011
Method and system for calibrating an X-ray photoelectron spectroscopy measurement
REVERA INC2 citations62
US7399963B2Jul 15, 2008
Photoelectron spectroscopy apparatus and method of use
REVERA INC3 citations62
US7996178B2Aug 9, 2011
Semiconductor substrate processing method and apparatus
REVERA INC4 citations54