Assignee
RIKA DENSHI AMERICA INC
US·2 granted patents·65 citations·filing 2005–2007
Top patents by PatentIndex Score
2 records- 0188US7545159B2Electrical test probes with a contact element, methods of making and using the sameRIKA DENSHI AMERICA INC·Filed 2007·Granted Jun 9, 2009·30 cites·21 claims
- 0288US7315176B2Electrical test probes, methods of making, and methods of usingRIKA DENSHI AMERICA INC·Filed 2005·Granted Jan 1, 2008·35 cites·22 claims
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