Assignee
RONTE SUNAO
JP·2 granted patents·0 citations·filing 2011–2017
Top patents by PatentIndex Score
2 records- 0134US8886486B2Device and method for testing APD measuring deviceRONTE SUNAO·Filed 2011·Granted Nov 11, 2014·0 cites·15 claims
- 0225US10798668B2Synchronization circuit, synchronization method, signal generating device, signal generating method, and recording mediumRONTE SUNAO·Filed 2017·Granted Oct 6, 2020·0 cites·8 claims
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