Individual holder
ROOT BRYAN J
US·8 granted patents·27 citations·filing 2010–2012
Individually held — no corporate assignee on record.
Top patents by PatentIndex Score
8 records- 0187US8149009B2Apparatus and method for terminating probe apparatus of semiconductor waferROOT BRYAN J·Filed 2010·Granted Apr 3, 2012·4 cites·7 claims
- 0285US8674715B2Test apparatus having a probe core with a twist lock mechanismROOT BRYAN J·Filed 2011·Granted Mar 18, 2014·6 cites·16 claims
- 0383US8860450B2Apparatus and method for terminating probe apparatus of semiconductor waferROOT BRYAN J·Filed 2012·Granted Oct 14, 2014·3 cites·6 claims
- 0480US8994390B2Test systems with a probe apparatus and index mechanismROOT BRYAN J·Filed 2012·Granted Mar 31, 2015·3 cites·13 claims
- 0578US9018966B2Test apparatus having a probe card and connector mechanismROOT BRYAN J·Filed 2012·Granted Apr 28, 2015·3 cites·11 claims
- 0677US9024651B2Test apparatus having a probe card and connector mechanismROOT BRYAN J·Filed 2012·Granted May 5, 2015·3 cites·2 claims
- 0746US8698515B2Probe test equipment for testing a semiconductor deviceROOT BRYAN J·Filed 2011·Granted Apr 15, 2014·0 cites·10 claims
- 0844USD654033SGrooved wire support for a probe test coreROOT BRYAN J·Filed 2010·Granted Feb 14, 2012·5 cites·1 claims
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