Assignee
ROTH WAYNE DENNIS
US·2 granted patents·8 citations·filing 2010–2010
Top patents by PatentIndex Score
2 records- 0184US8274656B2Apparatus, system, and method for increasing measurement accuracy in a particle imaging deviceROTH WAYNE DENNIS·Filed 2010·Granted Sep 25, 2012·6 cites·20 claims
- 0269US8767069B2Apparatus, system, and method for increasing measurement accuracy in a particle imaging device using light distributionROTH WAYNE DENNIS·Filed 2010·Granted Jul 1, 2014·2 cites·22 claims
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