Assignee
RYODEN SEMICONDUCTOR SYST ENG
JP·10 granted patents·246 citations·filing 1992–2004
Top patents by PatentIndex Score
10 records- 0182US6934648B2Jitter measurement circuit for measuring jitter of measurement target signal on the basis of sampling data string obtained by using ideal cyclic signalRYODEN SEMICONDUCTOR SYST ENG·Filed 2003·Granted Aug 23, 2005·27 cites·8 claims
- 0281US6900986B2Power moduleRYODEN SEMICONDUCTOR SYST ENG·Filed 2004·Granted May 31, 2005·25 cites·4 claims
- 0381US5440168AThin-film transistor with suppressed off-current and VthRYODEN SEMICONDUCTOR SYST ENG·Filed 1994·Granted Aug 8, 1995·40 cites·13 claims
- 0480US6993696B1Semiconductor memory device with built-in self test circuit operating at high rateRYODEN SEMICONDUCTOR SYST ENG·Filed 2000·Granted Jan 31, 2006·30 cites·2 claims
- 0573US5956859ADrying apparatus for processing surface of substrateRYODEN SEMICONDUCTOR SYST ENG·Filed 1997·Granted Sep 28, 1999·45 cites·18 claims
- 0673US5372295ASolder material, junctioning method, junction material, and semiconductor deviceRYODEN SEMICONDUCTOR SYST ENG·Filed 1992·Granted Dec 13, 1994·47 cites·23 claims
- 0761US6584592B2Semiconductor testing apparatus for testing semiconductor device including built in self test circuitRYODEN SEMICONDUCTOR SYST ENG·Filed 2001·Granted Jun 24, 2003·9 cites·8 claims
- 0858US6544904B1Method of manufacturing semiconductor deviceRYODEN SEMICONDUCTOR SYST ENG·Filed 2002·Granted Apr 8, 2003·7 cites·9 claims
- 0943US5792314AMethod of removing photosensitive resin and photosensitive resin removing apparatusRYODEN SEMICONDUCTOR SYST ENG·Filed 1995·Granted Aug 11, 1998·8 cites·10 claims
- 1039US5996242ADrying apparatus and methodRYODEN SEMICONDUCTOR SYST ENG·Filed 1997·Granted Dec 7, 1999·8 cites·20 claims
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