Assignee
SAI KYOKUYO
JP·2 granted patents·3 citations·filing 2010–2012
Top patents by PatentIndex Score
2 records- 0158US8922790B2Optical film thickness measuring device and thin film forming apparatus using the optical film thickness measuring deviceSAI KYOKUYO·Filed 2012·Granted Dec 30, 2014·2 cites·9 claims
- 0245US8625111B2Optical film thickness meter and thin film forming apparatus provided with optical film thickness meterSAI KYOKUYO·Filed 2010·Granted Jan 7, 2014·1 cites·11 claims
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