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SAKAI KAORU
JP8 patents
Top patents by PatentIndex Score
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Method and apparatus for inspecting pattern defects
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Method and apparatus for inspecting pattern defects
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Method and apparatus for inspecting patterns formed on a substrate
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Defect inspection method and apparatus therefor
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Method and apparatus for pattern inspection
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Pattern inspection method and its apparatus
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Apparatus and method for inspecting defect
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Method and apparatus for calculating game outcomes
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