Assignee
SAKAI KAZUFUMI
JP·2 granted patents·12 citations·filing 2009–2010
Top patents by PatentIndex Score
2 records- 0175US9019498B2Method for inspecting defects, inspected wafer or semiconductor device manufactured using the same, method for quality control of wafers or semiconductor devices and defect inspecting apparatusSAKAI KAZUFUMI·Filed 2010·Granted Apr 28, 2015·5 cites·20 claims
- 0274US8599379B2Method for inspecting defects and defect inspecting apparatusSAKAI KAZUFUMI·Filed 2009·Granted Dec 3, 2013·7 cites·13 claims
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