Assignee
SAKATA HIROSHI
JP·3 granted patents·1 pending application·2 citations·filing 2010–2012
Top patents by PatentIndex Score
4 records- 0163US8659311B2Test apparatus and test methodSAKATA HIROSHI·Filed 2011·Granted Feb 25, 2014·2 cites·5 claims
- 0241US8829952B2Gate drive circuitSAKATA HIROSHI·Filed 2012·Granted Sep 9, 2014·0 cites·16 claims
- 0337US8278957B2Circuit board unit and testing apparatusSAKATA HIROSHI·Filed 2010·Granted Oct 2, 2012·0 cites·18 claims
- 0435US2013093453A1Connecting device, semiconductor wafer test apparatus comprising same, and connecting methodSAKATA HIROSHI·Filed 2010·Application pending·0 cites
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