Assignee
SAMESHIMA TOSHIYUKI
JP·2 granted patents·0 citations·filing 2010–2011
Top patents by PatentIndex Score
2 records- 0135US8258043B2Manufacturing method of thin film semiconductor substrateSAMESHIMA TOSHIYUKI·Filed 2011·Granted Sep 4, 2012·0 cites·9 claims
- 0232US9239299B2Photoinduced carrier lifetime measuring method, light incidence efficiency measuring method, photoinduced carrier lifetime measuring device, and light incidence efficiency measuring deviceSAMESHIMA TOSHIYUKI·Filed 2010·Granted Jan 19, 2016·0 cites·11 claims
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