Assignee
SANGHANI AMIT
2 granted patents·1 pending application·28 citations·filing 2005–2012
Technology mixG01R3
Top patents by PatentIndex Score
3 records- 0190US8522190B1Power droop reduction via clock-gating for at-speed scan testingSANGHANI AMIT·Filed 2012·Granted Aug 27, 2013·12 cites·13 claims
- 0286US7305598B1Test clock generation for higher-speed testing of a semiconductor deviceSANGHANI AMIT·Filed 2005·Granted Dec 4, 2007·16 cites·22 claims
- 0339US2013271197A1Power droop reduction via clock-gating for at-speed scan testingSANGHANI AMIT·Filed 2012·Application pending·0 cites
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