Assignee
SASAJIMA FUMIHIRO
JP·2 granted patents·2 pending applications·5 citations·filing 2008–2011
Top patents by PatentIndex Score
4 records- 0189US8304724B2Microstructured pattern inspection methodSASAJIMA FUMIHIRO·Filed 2010·Granted Nov 6, 2012·5 cites·8 claims
- 0240US2009097735A1Sample inspection, measuring method and charged particle beam apparatusSASAJIMA FUMIHIRO·Filed 2008·Application pending·0 cites
- 0339US9104913B2Pattern measuring method, pattern measuring apparatus, and program using sameSASAJIMA FUMIHIRO·Filed 2011·Granted Aug 11, 2015·0 cites·10 claims
- 0435US2012138796A1Signal Processing Method for Charged Particle Beam Device, and Signal Processing DeviceSASAJIMA FUMIHIRO·Filed 2010·Application pending·0 cites
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