Assignee
SASAKI RYO
JP·4 granted patents·15 citations·filing 2008–2011
Top patents by PatentIndex Score
4 records- 0174US9164405B2Measurement apparatus for calculation of substrate tilt, exposure apparatus, and device fabrication methodSASAKI RYO·Filed 2010·Granted Oct 20, 2015·4 cites·4 claims
- 0274US8593615B2Height measurement apparatus, exposure apparatus, and device fabrication methodSASAKI RYO·Filed 2010·Granted Nov 26, 2013·4 cites·7 claims
- 0362US8233140B2Measuring apparatus, exposure apparatus, and device fabrication methodSASAKI RYO·Filed 2008·Granted Jul 31, 2012·4 cites·9 claims
- 0433USD649117SConnectorSASAKI RYO·Filed 2011·Granted Nov 22, 2011·3 cites·1 claims
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