Assignee
SAWA TAKESHI
JP·4 granted patents·35 citations·filing 2008–2011
Technology mixG01N4
Top patents by PatentIndex Score
4 records- 0185US8655602B2Hardness test method, hardness tester, and computer-readable storage medium storing programSAWA TAKESHI·Filed 2011·Granted Feb 18, 2014·7 cites·8 claims
- 0285US8087282B2Test management method for indentation tester and indentation testerSAWA TAKESHI·Filed 2008·Granted Jan 3, 2012·11 cites·4 claims
- 0384US8849588B2Hardness test method and programSAWA TAKESHI·Filed 2011·Granted Sep 30, 2014·6 cites·19 claims
- 0484US8074497B2Indentation testing instrument and indentation testing methodSAWA TAKESHI·Filed 2008·Granted Dec 13, 2011·11 cites·5 claims
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