Assignee
SEMITEST INC
US8 patents
Top patents by PatentIndex Score
US4827212AMay 2, 1989
Noninvasive method and apparatus for characterization of semiconductors
SEMITEST INC63 citations96
US5091691AFeb 25, 1992
Apparatus for making surface photovoltage measurements of a semiconductor
SEMITEST INC132 citations95
US4891584AJan 2, 1990
Apparatus for making surface photovoltage measurements of a semiconductor
SEMITEST INC218 citations94
US6163163ADec 19, 2000
Semiconductor material characterizing method and apparatus
SEMITEST INC23 citations90
US6097205AAug 1, 2000
Method and apparatus for characterizing a specimen of semiconductor material
SEMITEST INC51 citations90
US5453703ASep 26, 1995
Method for determining the minority carrier surface recombination lifetime constant (ts of a specimen of semiconductor material
SEMITEST INC41 citations90
US5087876AFeb 11, 1992
Apparatus and method for making surface photovoltage measurements of a semiconductor
SEMITEST INC42 citations89
US6034535AMar 7, 2000
Method utilizing a modulated light beam for determining characteristics such as the doping concentration profile of a specimen of semiconductor material
SEMITEST INC18 citations81