Assignee
SHIBATA YUKIHIRO
JP·9 granted patents·4 pending applications·33 citations·filing 2005–2013
Top patents by PatentIndex Score
13 records- 0195US8228494B2Apparatus for inspecting defectsSHIBATA YUKIHIRO·Filed 2011·Granted Jul 24, 2012·13 cites·11 claims
- 0288US8416402B2Method and apparatus for inspecting defectsSHIBATA YUKIHIRO·Filed 2012·Granted Apr 9, 2013·6 cites·14 claims
- 0379US8454754B2Cleaning method and method for manufacturing electronic deviceSHIBATA YUKIHIRO·Filed 2008·Granted Jun 4, 2013·6 cites·17 claims
- 0479US8203706B2Method and apparatus for inspecting defectsSHIBATA YUKIHIRO·Filed 2009·Granted Jun 19, 2012·5 cites·12 claims
- 0568US8804112B2Method of defect inspection and device of defect inspectionSHIBATA YUKIHIRO·Filed 2010·Granted Aug 12, 2014·2 cites·8 claims
- 0662US9255793B2Defect inspection method and device thereofSHIBATA YUKIHIRO·Filed 2011·Granted Feb 9, 2016·1 cites·7 claims
- 0757US2008225286A1Method And Apparatus For Detecting DefectsSHIBATA YUKIHIRO·Filed 2008·Application pending·0 cites
- 0854US8416292B2Defect inspection apparatus and methodSHIBATA YUKIHIRO·Filed 2009·Granted Apr 9, 2013·0 cites·14 claims
- 0950US2009059216A1Defect inspection method and defect inspection apparatusSHIBATA YUKIHIRO·Filed 2008·Application pending·0 cites
- 1049US8958062B2Defect inspection method and device using sameSHIBATA YUKIHIRO·Filed 2011·Granted Feb 17, 2015·0 cites·13 claims
- 1148US8751702B2Communication processing device that stores communication data in buffers, image forming apparatus, and method of communication processingSHIBATA YUKIHIRO·Filed 2013·Granted Jun 10, 2014·0 cites·15 claims
- 1240US2006078190A1Method and apparatus for inspecting defectsSHIBATA YUKIHIRO·Filed 2005·Application pending·0 cites
- 1340US2012019816A1Defect inspection method and defect inspection apparatusSHIBATA YUKIHIRO·Filed 2010·Application pending·0 cites
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