Assignee
SHICHI HIROYASU
JP8 patents
Top patents by PatentIndex Score
US8481980B2Jul 9, 2013
Ion source, ion beam processing/observation apparatus, charged particle beam apparatus, and method for observing cross section of sample
SHICHI HIROYASU17 citations92
US8263943B2Sep 11, 2012
Ion beam device
SHICHI HIROYASU16 citations92
US8115184B2Feb 14, 2012
Gas field ion source, charged particle microscope, and apparatus
SHICHI HIROYASU20 citations92
US8796651B2Aug 5, 2014
Method and apparatus for specimen fabrication
SHICHI HIROYASU2 citations62
US8563944B2Oct 22, 2013
Ion beam device
SHICHI HIROYASU3 citations62
US8530865B2Sep 10, 2013
Gas field ion source, charged particle microscope, and apparatus
SHICHI HIROYASU2 citations62
US8431891B2Apr 30, 2013
Dual beam apparatus with tilting sample stage
SHICHI HIROYASU3 citations62
US8779380B2Jul 15, 2014
Ion beam device
SHICHI HIROYASU0 citations51