Assignee
SHIFREN LUCIAN
US·7 granted patents·4 pending applications·113 citations·filing 2007–2014
Top patents by PatentIndex Score
11 records- 0197US8748270B1Process for manufacturing an improved analog transistorSHIFREN LUCIAN·Filed 2012·Granted Jun 10, 2014·41 cites·19 claims
- 0297US8421162B2Advanced transistors with punch through suppressionSHIFREN LUCIAN·Filed 2010·Granted Apr 16, 2013·30 cites·8 claims
- 0396US8748986B1Electronic device with controlled threshold voltageSHIFREN LUCIAN·Filed 2012·Granted Jun 10, 2014·25 cites·18 claims
- 0486US8569128B2Semiconductor structure and method of fabrication thereof with mixed metal typesSHIFREN LUCIAN·Filed 2010·Granted Oct 29, 2013·8 cites·10 claims
- 0584US8530286B2Low power semiconductor transistor structure and method of fabrication thereofSHIFREN LUCIAN·Filed 2010·Granted Sep 10, 2013·6 cites·19 claims
- 0671US9406567B1Method for fabricating multiple transistor devices on a substrate with varying threshold voltagesSHIFREN LUCIAN·Filed 2012·Granted Aug 2, 2016·3 cites·12 claims
- 0754US2013181298A1Advanced transistors with punch through suppressionSHIFREN LUCIAN·Filed 2013·Application pending·0 cites
- 0852US8963249B1Electronic device with controlled threshold voltageSHIFREN LUCIAN·Filed 2014·Granted Feb 24, 2015·0 cites·15 claims
- 0946US2011079861A1Advanced Transistors with Threshold Voltage Set Dopant StructuresSHIFREN LUCIAN·Filed 2010·Application pending·0 cites
- 1042US2009315120A1Raised facet- and non-facet 3d source/drain contacts in mosfetsSHIFREN LUCIAN·Filed 2008·Application pending·0 cites
- 1140US2009085097A1Methods of forming nitride stressing layer for replacement metal gate and structures formed therebySHIFREN LUCIAN·Filed 2007·Application pending·0 cites
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