Assignee
SHIMURA KEI
JP6 patents
Top patents by PatentIndex Score
US8131058B2Mar 6, 2012
Method and apparatus for visual inspection
SHIMURA KEI11 citations83
US8126259B2Feb 28, 2012
Method and apparatus for visual inspection
SHIMURA KEI12 citations83
US9851548B2Dec 26, 2017
Optical microscope device and testing apparatus comprising same
SHIMURA KEI2 citations67
US8879821B2Nov 4, 2014
Defect inspecting device and defect inspecting method
SHIMURA KEI2 citations62
US8472697B2Jun 25, 2013
Method and apparatus for visual inspection
SHIMURA KEI2 citations62
US8194969B2Jun 5, 2012
Method and apparatus for visual inspection
SHIMURA KEI2 citations62