Assignee
SHIN HYUN CHUL
KR·1 granted patent·1 pending application·5 citations·filing 2010–2022
Top patents by PatentIndex Score
2 records- 0173US8178928B2Intermediate structures having reduced width contact holes that are formed during manufacture of memory cells having contact structuresSHIN HYUN-CHUL·Filed 2010·Granted May 15, 2012·5 cites·7 claims
- 0247US2024303750A1Individual or group reputation evaluation system and methodSHIN HYUN CHUL·Filed 2022·Application pending·0 cites
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