Assignee
SHINAGAWA MASATOSHI
JP·2 granted patents·2 pending applications·1 citations·filing 2006–2012
Top patents by PatentIndex Score
4 records- 0146US8552549B2Semiconductor device, and inspection method thereofSHINAGAWA MASATOSHI·Filed 2012·Granted Oct 8, 2013·0 cites·21 claims
- 0246US8148810B2Semiconductor device, and inspection method thereofSHINAGAWA MASATOSHI·Filed 2006·Granted Apr 3, 2012·1 cites·19 claims
- 0339US2009261465A1Semiconductor device and its manufacturing methodSHINAGAWA MASATOSHI·Filed 2009·Application pending·0 cites
- 0439US2010084761A1Semiconductor device and fabrication method of the sameSHINAGAWA MASATOSHI·Filed 2009·Application pending·0 cites
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