Assignee
SHIODA MICHINORI
JP·3 granted patents·4 citations·filing 2009–2011
Top patents by PatentIndex Score
3 records- 0174US8527227B2Method and device for measuring electromagnetic waveSHIODA MICHINORI·Filed 2011·Granted Sep 3, 2013·4 cites·14 claims
- 0246US8258477B2Inspection apparatus and inspection methodSHIODA MICHINORI·Filed 2009·Granted Sep 4, 2012·0 cites·9 claims
- 0338US9104912B2Apparatus and method for measuring electromagnetic waveSHIODA MICHINORI·Filed 2010·Granted Aug 11, 2015·0 cites·11 claims
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