Assignee
SHITARA KENICHI
JP·6 granted patents·2 pending applications·5 citations·filing 2007–2012
Top patents by PatentIndex Score
8 records- 0170US8294888B2Surface defect inspection method and apparatusSHITARA KENICHI·Filed 2010·Granted Oct 23, 2012·1 cites·7 claims
- 0270US8089714B2Deterioration detection method of composite magnetic head and magnetic disk inspection apparatusSHITARA KENICHI·Filed 2010·Granted Jan 3, 2012·3 cites·10 claims
- 0360US8295000B2Method and its apparatus for inspecting a magnetic diskSHITARA KENICHI·Filed 2011·Granted Oct 23, 2012·1 cites·16 claims
- 0458US8502966B2Surface defect inspection method and apparatusSHITARA KENICHI·Filed 2012·Granted Aug 6, 2013·0 cites·5 claims
- 0558US8488116B2Surface defect inspection method and apparatusSHITARA KENICHI·Filed 2012·Granted Jul 16, 2013·0 cites·6 claims
- 0647US2007245814A1Magnetic disk defect test method, protrusion test device and glide testerSHITARA KENICHI·Filed 2007·Application pending·0 cites
- 0738US2012026622A1Method and apparatus for inspecting magnetic diskSHITARA KENICHI·Filed 2011·Application pending·0 cites
- 0836US8457926B2Disk protrusion detection/flatness measurement circuit and disk glide testerSHITARA KENICHI·Filed 2010·Granted Jun 4, 2013·0 cites·4 claims
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