Assignee
SHROFF MEHUL D
US·27 granted patents·1 pending application·206 citations·filing 2006–2014
Top patents by PatentIndex Score
28 records- 0197US8536006B2Logic and non-volatile memory (NVM) integrationSHROFF MEHUL D·Filed 2011·Granted Sep 17, 2013·34 cites·20 claims
- 0297US8399310B2Non-volatile memory and logic circuit process integrationSHROFF MEHUL D·Filed 2010·Granted Mar 19, 2013·36 cites·10 claims
- 0397US8389365B2Non-volatile memory and logic circuit process integrationSHROFF MEHUL D·Filed 2011·Granted Mar 5, 2013·35 cites·20 claims
- 0491US8601430B1Device matching tool and methods thereofSHROFF MEHUL D·Filed 2012·Granted Dec 3, 2013·13 cites·20 claims
- 0589US9455220B2Apparatus and method for placing stressors on interconnects within an integrated circuit device to manage electromigration failuresSHROFF MEHUL D·Filed 2014·Granted Sep 27, 2016·8 cites·9 claims
- 0688US9112056B1Method for forming a split-gate deviceSHROFF MEHUL D·Filed 2014·Granted Aug 18, 2015·9 cites·20 claims
- 0788US8569816B2Isolated capacitors within shallow trench isolationSHROFF MEHUL D·Filed 2011·Granted Oct 29, 2013·10 cites·21 claims
- 0887US8595667B1Via placement and electronic circuit design processing method and electronic circuit design utilizing sameSHROFF MEHUL D·Filed 2012·Granted Nov 26, 2013·10 cites·6 claims
- 0986US8713498B2Method and system for physical verification using network segment currentSHROFF MEHUL D·Filed 2011·Granted Apr 29, 2014·10 cites·17 claims
- 1083US8906764B2Non-volatile memory (NVM) and logic integrationSHROFF MEHUL D·Filed 2012·Granted Dec 9, 2014·7 cites·20 claims
- 1182US8756559B2Systems and methods for determining aging damage for semiconductor devicesSHROFF MEHUL D·Filed 2012·Granted Jun 17, 2014·9 cites·18 claims
- 1277US8832624B1Multi-layer process-induced damage tracking and remediationSHROFF MEHUL D·Filed 2013·Granted Sep 9, 2014·4 cites·20 claims
- 1376US9111865B2Method of making a logic transistor and a non-volatile memory (NVM) cellSHROFF MEHUL D·Filed 2012·Granted Aug 18, 2015·4 cites·20 claims
- 1473US9443804B2Capping layer interface interruption for stress migration mitigationSHROFF MEHUL D·Filed 2013·Granted Sep 13, 2016·3 cites·17 claims
- 1571US8658497B2Non-volatile memory (NVM) and logic integrationSHROFF MEHUL D·Filed 2012·Granted Feb 25, 2014·3 cites·14 claims
- 1671US8564044B2Non-volatile memory and logic circuit process integrationSHROFF MEHUL D·Filed 2011·Granted Oct 22, 2013·3 cites·18 claims
- 1769US8877568B2Methods of making logic transistors and non-volatile memory cellsSHROFF MEHUL D·Filed 2013·Granted Nov 4, 2014·2 cites·19 claims
- 1866US8574987B1Integrating formation of a replacement gate transistor and a non-volatile memory cell using an interlayer dielectricSHROFF MEHUL D·Filed 2012·Granted Nov 5, 2013·2 cites·20 claims
- 1966US8318576B2Decoupling capacitors recessed in shallow trench isolationSHROFF MEHUL D·Filed 2011·Granted Nov 27, 2012·2 cites·18 claims
- 2063US8557650B2Patterning a gate stack of a non-volatile memory (NVM) using a dummy gate stackSHROFF MEHUL D·Filed 2010·Granted Oct 15, 2013·1 cites·8 claims
- 2162US8856705B2Mismatch verification device and methods thereofSHROFF MEHUL D·Filed 2012·Granted Oct 7, 2014·1 cites·20 claims
- 2247US9231077B2Method of making a logic transistor and non-volatile memory (NVM) cellSHROFF MEHUL D·Filed 2014·Granted Jan 5, 2016·0 cites·20 claims
- 2346US9685405B2Fuse/resistor utilizing interconnect and vias and method of makingSHROFF MEHUL D·Filed 2013·Granted Jun 20, 2017·0 cites·4 claims
- 2444US8709883B2Implant for performance enhancement of selected transistors in an integrated circuitSHROFF MEHUL D·Filed 2011·Granted Apr 29, 2014·0 cites·16 claims
- 2542US2007196988A1Poly pre-doping anneals for improved gate profilesSHROFF MEHUL D·Filed 2006·Application pending·0 cites
- 2641US8941242B2Method of protecting against via failure and structure thereforSHROFF MEHUL D·Filed 2011·Granted Jan 27, 2015·0 cites·9 claims
- 2739US8877601B2Lateral capacitor and method of makingSHROFF MEHUL D·Filed 2010·Granted Nov 4, 2014·0 cites·14 claims
- 2838US8202778B2Patterning a gate stack of a non-volatile memory (NVM) with simultaneous etch in non-NVM areaSHROFF MEHUL D·Filed 2010·Granted Jun 19, 2012·0 cites·20 claims
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