Assignee
SII NANOTECHNOLOGY INC
JP·164 granted patents·1,385 citations·filing 1999–2010
Top patents by PatentIndex Score
164 records- 0196US6798863B2Combined x-ray analysis apparatusSII NANOTECHNOLOGY INC·Filed 2002·Granted Sep 28, 2004·74 cites·10 claims
- 0295US7589323B2Superconducting X-ray detector and X-ray analysis apparatus using the sameSII NANOTECHNOLOGY INC·Filed 2006·Granted Sep 15, 2009·41 cites·4 claims
- 0394US8000439B2X-ray analyzer and X-ray analysis methodSII NANOTECHNOLOGY INC·Filed 2009·Granted Aug 16, 2011·22 cites·5 claims
- 0494US6852973B2Scanning charged particle microscopeSII NANOTECHNOLOGY INC·Filed 2003·Granted Feb 8, 2005·54 cites·15 claims
- 0593US7627088B2X-ray tube and X-ray analysis apparatusSII NANOTECHNOLOGY INC·Filed 2008·Granted Dec 1, 2009·20 cites·5 claims
- 0693US7189655B2Method of correcting amplitude defect in multilayer film of EUVL maskSII NANOTECHNOLOGY INC·Filed 2005·Granted Mar 13, 2007·18 cites·7 claims
- 0793US7098453B2Scanning probe microscopy system and method of measurement by the sameSII NANOTECHNOLOGY INC·Filed 2005·Granted Aug 29, 2006·39 cites·20 claims
- 0893US6810106B2X-ray fluorescence thickness measurement deviceSII NANOTECHNOLOGY INC·Filed 2001·Granted Oct 26, 2004·59 cites·26 claims
- 0992US7970101B2X-ray analyzer and X-ray analysis methodSII NANOTECHNOLOGY INC·Filed 2009·Granted Jun 28, 2011·23 cites·8 claims
- 1092US7680248B2X-ray tube and X-ray analyzing apparatusSII NANOTECHNOLOGY INC·Filed 2008·Granted Mar 16, 2010·16 cites·12 claims
- 1192US7442942B2Charged particle beam apparatusSII NANOTECHNOLOGY INC·Filed 2006·Granted Oct 28, 2008·20 cites·5 claims
- 1291US8024816B2Approach method for probe and sample in scanning probe microscopeSII NANOTECHNOLOGY INC·Filed 2010·Granted Sep 20, 2011·13 cites·7 claims
- 1391US7436926B2Fluorescent X-ray analysis apparatusSII NANOTECHNOLOGY INC·Filed 2007·Granted Oct 14, 2008·19 cites·16 claims
- 1491US6885727B2Apparatus and method for measuring thickness and composition of multi-layered sampleSII NANOTECHNOLOGY INC·Filed 2002·Granted Apr 26, 2005·45 cites·12 claims
- 1589US7718981B2Composite charged-particle beam systemSII NANOTECHNOLOGY INC·Filed 2008·Granted May 18, 2010·12 cites·1 claims
- 1689US7634053B2Fluorescent X-ray analysis apparatusSII NANOTECHNOLOGY INC·Filed 2007·Granted Dec 15, 2009·14 cites·11 claims
- 1789US7587025B2X-ray analysis apparatus and X-ray analysis methodSII NANOTECHNOLOGY INC·Filed 2008·Granted Sep 8, 2009·16 cites·6 claims
- 1889US7455449B2Differential scanning calorimeterSII NANOTECHNOLOGY INC·Filed 2007·Granted Nov 25, 2008·16 cites·6 claims
- 1989US7428293B2Fluorescent X-ray analysis apparatusSII NANOTECHNOLOGY INC·Filed 2007·Granted Sep 23, 2008·16 cites·15 claims
- 2089US7154106B2Composite system of scanning electron microscope and focused ion beamSII NANOTECHNOLOGY INC·Filed 2005·Granted Dec 26, 2006·16 cites·20 claims
- 2188US7634054B2X-ray tube and X-ray analysis apparatusSII NANOTECHNOLOGY INC·Filed 2008·Granted Dec 15, 2009·12 cites·6 claims
- 2288US7424093B2Fluorescent x-ray analysis apparatusSII NANOTECHNOLOGY INC·Filed 2007·Granted Sep 9, 2008·14 cites·11 claims
- 2388US7288762B2Fine-adjustment mechanism for scanning probe microscopySII NANOTECHNOLOGY INC·Filed 2005·Granted Oct 30, 2007·14 cites·5 claims
- 2488US7170054B2Scanning probe microscopy cantilever holder and scanning probe microscope using the cantilever holderSII NANOTECHNOLOGY INC·Filed 2005·Granted Jan 30, 2007·12 cites·14 claims
- 2587US7802916B2Differential scanning calorimeterSII NANOTECHNOLOGY INC·Filed 2007·Granted Sep 28, 2010·12 cites·2 claims
- 2686US7973942B2Optical displacement detection mechanism and surface information measurement device using the sameSII NANOTECHNOLOGY INC·Filed 2007·Granted Jul 5, 2011·13 cites·14 claims
- 2786US7700367B2Method of making lamina specimenSII NANOTECHNOLOGY INC·Filed 2004·Granted Apr 20, 2010·23 cites·1 claims
- 2886US7547137B2Freezing point temperature measuring method and temperature calibrating method in differential scanning calorimetrySII NANOTECHNOLOGY INC·Filed 2007·Granted Jun 16, 2009·12 cites·18 claims
- 2986US6864481B2Probe for scanning probe microscopeSII NANOTECHNOLOGY INC·Filed 2002·Granted Mar 8, 2005·62 cites·22 claims
- 3085US7573047B2Wafer holder and sample producing apparatus using itSII NANOTECHNOLOGY INC·Filed 2007·Granted Aug 11, 2009·9 cites·6 claims
- 3185US6870161B2Apparatus for processing and observing a sampleSII NANOTECHNOLOGY INC·Filed 2003·Granted Mar 22, 2005·23 cites·20 claims
- 3285US6838685B1Ion beam apparatus, ion beam processing method and sample holder memberSII NANOTECHNOLOGY INC·Filed 2003·Granted Jan 4, 2005·26 cites·17 claims
- 3383US7973280B2Composite charged particle beam apparatus, method of processing a sample and method of preparing a sample for a transmission electron microscope using the sameSII NANOTECHNOLOGY INC·Filed 2009·Granted Jul 5, 2011·7 cites·9 claims
- 3483US7375352B2Photomask defect correction method employing a combined device of a focused electron beam device and an atomic force microscopeSII NANOTECHNOLOGY INC·Filed 2005·Granted May 20, 2008·9 cites·15 claims
- 3583US7173261B2Image noise removing method in FIB/SEM complex apparatusSII NANOTECHNOLOGY INC·Filed 2005·Granted Feb 6, 2007·6 cites·4 claims
- 3682US8359180B2Thermal analysis apparatusSII NANOTECHNOLOGY INC·Filed 2010·Granted Jan 22, 2013·6 cites·6 claims
- 3781US7755065B2Focused ion beam apparatusSII NANOTECHNOLOGY INC·Filed 2008·Granted Jul 13, 2010·7 cites·10 claims
- 3881US7626165B2Focused ion beam apparatus and method of preparing/observing sampleSII NANOTECHNOLOGY INC·Filed 2007·Granted Dec 1, 2009·7 cites·14 claims
- 3981US7508907B2X-ray analysis apparatusSII NANOTECHNOLOGY INC·Filed 2007·Granted Mar 24, 2009·12 cites·15 claims
- 4081US7423266B2Sample height regulating method, sample observing method, sample processing method and charged particle beam apparatusSII NANOTECHNOLOGY INC·Filed 2006·Granted Sep 9, 2008·7 cites·20 claims
- 4180US7910888B2X-ray analyzerSII NANOTECHNOLOGY INC·Filed 2008·Granted Mar 22, 2011·11 cites·6 claims
- 4280US7107826B2Scanning probe device and processing method by scanning probeSII NANOTECHNOLOGY INC·Filed 2005·Granted Sep 19, 2006·6 cites·23 claims
- 4379US7404313B2Scanning probe microscopeSII NANOTECHNOLOGY INC·Filed 2006·Granted Jul 29, 2008·7 cites·4 claims
- 4479US7289598B2X-ray fluorescent analysis apparatusSII NANOTECHNOLOGY INC·Filed 2005·Granted Oct 30, 2007·6 cites·8 claims
- 4578US7550723B2Atom probe apparatus and method for working sample preliminary for the sameSII NANOTECHNOLOGY INC·Filed 2005·Granted Jun 23, 2009·5 cites·11 claims
- 4678US7018683B2Electron beam processing methodSII NANOTECHNOLOGY INC·Filed 2004·Granted Mar 28, 2006·16 cites·12 claims
- 4777US7770474B2Sample operation apparatusSII NANOTECHNOLOGY INC·Filed 2007·Granted Aug 10, 2010·6 cites·6 claims
- 4876US7750318B2Working method by focused ion beam and focused ion beam working apparatusSII NANOTECHNOLOGY INC·Filed 2006·Granted Jul 6, 2010·4 cites·4 claims
- 4976US7284415B2Scanning probe microscopeSII NANOTECHNOLOGY INC·Filed 2005·Granted Oct 23, 2007·5 cites·12 claims
- 5076US7235783B2Gas blowing nozzle of charged particle beam apparatus and charged particle beam apparatus as well as working methodSII NANOTECHNOLOGY INC·Filed 2005·Granted Jun 26, 2007·3 cites·16 claims
Showing the top 50 of 164 patent records by PatentIndex Score.
Join the waitlist — get patent alerts
Get an alert when SII NANOTECHNOLOGY INC files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →