Assignee
SILICON CONNECTIONS CORP
US·4 granted patents·249 citations·filing 1988–1989
Top patents by PatentIndex Score
4 records- 0194US5047711AWafer-level burn-in testing of integrated circuitsSILICON CONNECTIONS CORP·Filed 1989·Granted Sep 10, 1991·134 cites·9 claims
- 0288US4875003ANon-contact I/O signal pad scan testing of VLSI circuitsSILICON CONNECTIONS CORP·Filed 1989·Granted Oct 17, 1989·73 cites·5 claims
- 0376US4845385ABiCMOS logic circuits with reduced crowbar currentSILICON CONNECTIONS CORP·Filed 1988·Granted Jul 4, 1989·26 cites·15 claims
- 0462US4970414ATTL-level-output interface circuitSILICON CONNECTIONS CORP·Filed 1989·Granted Nov 13, 1990·16 cites·13 claims
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