Assignee
SILICON METRICS CORP
US·5 granted patents·3 pending applications·88 citations·filing 1998–2003
Top patents by PatentIndex Score
8 records- 0176US6584598B2Apparatus for optimized constraint characterization with degradation options and associated methodsSILICON METRICS CORP·Filed 2001·Granted Jun 24, 2003·34 cites·24 claims
- 0267US6766506B1Interconnect model compilerSILICON METRICS CORP·Filed 2000·Granted Jul 20, 2004·14 cites·10 claims
- 0356US6931634B2Encrypted compilerSILICON METRICS CORP·Filed 2000·Granted Aug 16, 2005·5 cites·48 claims
- 0455US6327557B1Method and system for creating electronic circuitrySILICON METRICS CORP·Filed 1998·Granted Dec 4, 2001·27 cites·48 claims
- 0547US6862600B2Rapid parameter passing between multiple program portions for efficient procedural interaction with minimum calls and/or call backsSILICON METRICS CORP·Filed 2001·Granted Mar 1, 2005·8 cites·24 claims
- 0643US2003229728A1Apparatus and methods for circuit characterization by using a simulation compilerSILICON METRICS CORP·Filed 2003·Application pending·0 cites
- 0742US2002046015A1Method and system for creating electronic circuitrySILICON METRICS CORP·Filed 2001·Application pending·0 cites
- 0838US2003212964A1Apparatus for optimized constraint characterization with degradation options and associated methodsSILICON METRICS CORP·Filed 2003·Application pending·0 cites
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