P

Assignee

SISCAN SYSTEMS INC

US5 patents

Top patents by PatentIndex Score

US5184021AFeb 2, 1993

Method and apparatus for measuring the dimensions of patterned features on a lithographic photomask

SISCAN SYSTEMS INC53 citations96
US4748335AMay 31, 1988

Method and aparatus for determining surface profiles

SISCAN SYSTEMS INC70 citations95
US4707610ANov 17, 1987

Method and apparatus for measuring surface profiles

SISCAN SYSTEMS INC45 citations91
US4634880AJan 6, 1987

Confocal optical imaging system with improved signal-to-noise ratio

SISCAN SYSTEMS INC45 citations91
US4847823AJul 11, 1989

Method and apparatus for reading or measuring magneto-optical storage media using pinhole aperture

SISCAN SYSTEMS INC13 citations72