Assignee
ST MICROELECTRONICS INT NV
CH·790 granted patents·963 pending applications·1,314 citations·filing 2009–2025
Top patents by PatentIndex Score
1,753 records- 0198US11119153B1Isolation enable test coverage for multiple power domainsST MICROELECTRONICS INT NV·Filed 2020·Granted Sep 14, 2021·11 cites·20 claims
- 0297US11031865B2Charge pump circuit configured for positive and negative voltage generationST MICROELECTRONICS INT NV·Filed 2020·Granted Jun 8, 2021·4 cites·26 claims
- 0397US9634562B1Voltage doubling circuit and charge pump applications for the voltage doubling circuitST MICROELECTRONICS INT NV·Filed 2016·Granted Apr 25, 2017·22 cites·40 claims
- 0497US9054637B1Amplitude limiting circuit for a crystal oscillatorST MICROELECTRONICS INT NV·Filed 2014·Granted Jun 9, 2015·23 cites·20 claims
- 0597US9018987B1Current reused stacked ring oscillator and injection locked divider, injection locked multiplierST MICROELECTRONICS INT NV·Filed 2013·Granted Apr 28, 2015·27 cites·18 claims
- 0696US11782092B1Scan compression through pin data encodingST MICROELECTRONICS INT NV·Filed 2022·Granted Oct 10, 2023·6 cites·20 claims
- 0796US11424676B2Positive and negative charge pump controlST MICROELECTRONICS INT NV·Filed 2021·Granted Aug 23, 2022·3 cites·12 claims
- 0896US10050524B1Circuit for level shifting a clock signal using a voltage multiplierST MICROELECTRONICS INT NV·Filed 2017·Granted Aug 14, 2018·17 cites·37 claims
- 0996US9396790B1Multi-supply dual port register fileST MICROELECTRONICS INT NV·Filed 2015·Granted Jul 19, 2016·39 cites·20 claims
- 1095US11217323B1Circuit and method for capturing and transporting data errorsST MICROELECTRONICS INT NV·Filed 2020·Granted Jan 4, 2022·13 cites·25 claims
- 1195US11094376B2In-memory compute array with integrated bias elementsST MICROELECTRONICS INT NV·Filed 2020·Granted Aug 17, 2021·6 cites·21 claims
- 1295US9997236B1Read assist circuit with process, voltage and temperature tracking for a static random access memory (SRAM)ST MICROELECTRONICS INT NV·Filed 2016·Granted Jun 12, 2018·25 cites·25 claims
- 1395US9698771B1Testing of power on reset (POR) and unmaskable voltage monitorsST MICROELECTRONICS INT NV·Filed 2016·Granted Jul 4, 2017·24 cites·26 claims
- 1495US9305633B2SRAM cell and cell layout methodST MICROELECTRONICS INT NV·Filed 2014·Granted Apr 5, 2016·27 cites·36 claims
- 1594US12348201B2Squelch detection deviceST MICROELECTRONICS INT NV·Filed 2021·Granted Jul 1, 2025·2 cites·17 claims
- 1694US11552646B2Timing skew mismatch calibration for time interleaved analog to digital convertersST MICROELECTRONICS INT NV·Filed 2021·Granted Jan 10, 2023·4 cites·30 claims
- 1794US11418204B2Phase lock loop (PLL) with operating parameter calibration circuit and methodST MICROELECTRONICS INT NV·Filed 2021·Granted Aug 16, 2022·8 cites·27 claims
- 1894US9985732B2Method for phase calibration in a frontend circuit of a near field communication deviceST MICROELECTRONICS INT NV·Filed 2017·Granted May 29, 2018·16 cites·20 claims
- 1994US9793906B1Range and process compensation for a digital phase locked loop (PLL) or frequency locked loop (FLL) circuitST MICROELECTRONICS INT NV·Filed 2016·Granted Oct 17, 2017·20 cites·16 claims
- 2094US9755621B1Single stage cascoded voltage level shifting circuitST MICROELECTRONICS INT NV·Filed 2016·Granted Sep 5, 2017·25 cites·22 claims
- 2194US9705520B1Circuit and method for generating reference signals for hybrid analog-to-digital convertorsST MICROELECTRONICS INT NV·Filed 2016·Granted Jul 11, 2017·10 cites·26 claims
- 2293US12008200B1Capacitive scan method without display flickerST MICROELECTRONICS INT NV·Filed 2023·Granted Jun 11, 2024·2 cites·21 claims
- 2393US11714131B1Circuit and method for scan testingST MICROELECTRONICS INT NV·Filed 2022·Granted Aug 1, 2023·7 cites·20 claims
- 2493US11522553B2Sigma-delta analog-to-digital converter circuit with real time correction for digital-to-analog converter mismatch errorST MICROELECTRONICS INT NV·Filed 2021·Granted Dec 6, 2022·3 cites·35 claims
- 2593US11442108B1Isolation logic test circuit and associated test methodST MICROELECTRONICS INT NV·Filed 2021·Granted Sep 13, 2022·4 cites·24 claims
- 2693US10355694B1Level shifting circuit with conditional body biasing of transistorsST MICROELECTRONICS INT NV·Filed 2018·Granted Jul 16, 2019·9 cites·29 claims
- 2793US9379728B1Self-calibrated digital-to-analog converterST MICROELECTRONICS INT NV·Filed 2015·Granted Jun 28, 2016·23 cites·24 claims
- 2893US9276477B2DC-DC converter with enhanced automatic switching between CCM and DCM operating modesST MICROELECTRONICS INT NV·Filed 2013·Granted Mar 1, 2016·25 cites·19 claims
- 2992US12009830B2Timing skew mismatch calibration for time interleaved analog to digital convertersST MICROELECTRONICS INT NV·Filed 2022·Granted Jun 11, 2024·2 cites·22 claims
- 3092US11699995B2Multiplexer with highly linear analog switchST MICROELECTRONICS INT NV·Filed 2021·Granted Jul 11, 2023·2 cites·19 claims
- 3192US11025263B2Adaptive low power common mode bufferST MICROELECTRONICS INT NV·Filed 2020·Granted Jun 1, 2021·3 cites·26 claims
- 3292US10530366B1Low voltage differential signaling fault detectorST MICROELECTRONICS INT NV·Filed 2019·Granted Jan 7, 2020·6 cites·20 claims
- 3392US10291389B1Two-point modulator with matching gain calibrationST MICROELECTRONICS INT NV·Filed 2018·Granted May 14, 2019·14 cites·33 claims
- 3492US10224922B1Biasing cascode transistor of an output buffer circuit for operation over a wide range of supply voltagesST MICROELECTRONICS INT NV·Filed 2018·Granted Mar 5, 2019·9 cites·23 claims
- 3592US9325324B1Phase locked loop (PLL) circuit with compensated bandwidth across process, voltage and temperatureST MICROELECTRONICS INT NV·Filed 2014·Granted Apr 26, 2016·13 cites·24 claims
- 3691US12170103B2System and method for disk drive fly height measurementST MICROELECTRONICS INT NV·Filed 2023·Granted Dec 17, 2024·2 cites·20 claims
- 3791US11901919B2On chip test architecture for continuous time delta sigma analog-to-digital converterST MICROELECTRONICS INT NV·Filed 2022·Granted Feb 13, 2024·2 cites·22 claims
- 3891US10811960B2Voltage multiplier circuit with a common bulk and configured for positive and negative voltage generationST MICROELECTRONICS INT NV·Filed 2019·Granted Oct 20, 2020·5 cites·26 claims
- 3991US10461636B2Voltage multiplier circuit with a common bulk and configured for positive and negative voltage generationST MICROELECTRONICS INT NV·Filed 2018·Granted Oct 29, 2019·5 cites·54 claims
- 4091US10090845B1Fraction-N digital PLL capable of canceling quantization noise from sigma-delta modulatorST MICROELECTRONICS INT NV·Filed 2017·Granted Oct 2, 2018·11 cites·21 claims
- 4191US9258008B2Adaptive delay based asynchronous successive approximation analog-to-digital converterST MICROELECTRONICS INT NV·Filed 2014·Granted Feb 9, 2016·12 cites·21 claims
- 4291US8879222B2Trigger circuit and method of using sameST MICROELECTRONICS INT NV·Filed 2012·Granted Nov 4, 2014·9 cites·22 claims
- 4390US12050703B1Method of performing an authentication method and a pairing of a peripheral device to a companion deviceST MICROELECTRONICS INT NV·Filed 2023·Granted Jul 30, 2024·2 cites·30 claims
- 4490US11550348B2Methods and devices for bypassing a voltage regulatorST MICROELECTRONICS INT NV·Filed 2021·Granted Jan 10, 2023·3 cites·22 claims
- 4590US10996266B2System and method for testing voltage monitorsST MICROELECTRONICS INT NV·Filed 2019·Granted May 4, 2021·4 cites·25 claims
- 4690US10185338B1Digital low drop-out (LDO) voltage regulator with analog-assisted dynamic reference correctionST MICROELECTRONICS INT NV·Filed 2017·Granted Jan 22, 2019·14 cites·15 claims
- 4789US11984151B2Adaptive bit line overdrive control for an in-memory compute operation where simultaneous access is made to plural rows of a static random access memory (SRAM)ST MICROELECTRONICS INT NV·Filed 2022·Granted May 14, 2024·3 cites·32 claims
- 4889US11726140B2Scan circuit and methodST MICROELECTRONICS INT NV·Filed 2021·Granted Aug 15, 2023·2 cites·21 claims
- 4989US11431342B2High performance phase locked loop for millimeter wave applicationsST MICROELECTRONICS INT NV·Filed 2021·Granted Aug 30, 2022·3 cites·31 claims
- 5089US11340292B2System and method for parallel testing of electronic deviceST MICROELECTRONICS INT NV·Filed 2019·Granted May 24, 2022·3 cites·20 claims
Showing the top 50 of 1,753 patent records by PatentIndex Score.
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