Assignee
STAR TECH INC
TW·15 granted patents·8 pending applications·5 citations·filing 2013–2024
Top patents by PatentIndex Score
23 records- 0185US11307246B2Probing apparatus and method of operating the sameSTAR TECH INC·Filed 2019·Granted Apr 19, 2022·3 cites·19 claims
- 0278US11209462B1Testing apparatusSTAR TECH INC·Filed 2020·Granted Dec 28, 2021·1 cites·14 claims
- 0373US11054465B2Method of operating a probing apparatusSTAR TECH INC·Filed 2019·Granted Jul 6, 2021·1 cites·15 claims
- 0472US12498397B2Probe card and thermal conduction device thereofSTAR TECH INC·Filed 2023·Granted Dec 16, 2025·0 cites·14 claims
- 0566US11828789B2Test apparatus and jumper thereofSTAR TECH INC·Filed 2022·Granted Nov 28, 2023·0 cites·17 claims
- 0660US11953518B2Switching matrix system and operating method thereof for semiconductor characteristic measurementSTAR TECH INC·Filed 2020·Granted Apr 9, 2024·0 cites·20 claims
- 0760US11047880B2Probing deviceSTAR TECH INC·Filed 2019·Granted Jun 29, 2021·0 cites·19 claims
- 0859US2026043831A1Removable probe cardSTAR TECH INC·Filed 2024·Application pending·0 cites
- 0958US12355430B2High-power product switch protection system and high power product switch protection methodSTAR TECH INC·Filed 2023·Granted Jul 8, 2025·0 cites·6 claims
- 1058US2025052785A1Probe card structureSTAR TECH INC·Filed 2023·Application pending·0 cites
- 1158US2024410918A1Probe card structure for high frequency test and testing method thereofSTAR TECH INC·Filed 2023·Application pending·0 cites
- 1255US2024319230A1Probe card, and supporting structure and probe structure thereofSTAR TECH INC·Filed 2023·Application pending·0 cites
- 1354US11217649B2Method of testing and analyzing display panelSTAR TECH INC·Filed 2020·Granted Jan 4, 2022·0 cites·18 claims
- 1450US2023400480A1Probe device, probe system including the probe device and operating method thereofSTAR TECH INC·Filed 2023·Application pending·0 cites
- 1550US2024168057A1Probe card for high-frequency testingSTAR TECH INC·Filed 2023·Application pending·0 cites
- 1650US2025130253A1Management system for probe cardsSTAR TECH INC·Filed 2023·Application pending·0 cites
- 1749US10890614B2Method for determining a junction temperature of a device under test and method for controlling a junction temperature of a device under testSTAR TECH INC·Filed 2019·Granted Jan 12, 2021·0 cites·17 claims
- 1849US9535114B2Testing deviceSTAR TECH INC·Filed 2013·Granted Jan 3, 2017·0 cites·19 claims
- 1947US10184957B2Testing apparatus, holding assembly, and probe card carrierSTAR TECH INC·Filed 2016·Granted Jan 22, 2019·0 cites·37 claims
- 2045US2022178969A1Probe device and method of assembling the sameSTAR TECH INC·Filed 2020·Application pending·0 cites
- 2143US11754619B2Probing apparatus with temperature-adjusting mechanismSTAR TECH INC·Filed 2021·Granted Sep 12, 2023·0 cites·22 claims
- 2241US9739830B2Test assemblySTAR TECH INC·Filed 2014·Granted Aug 22, 2017·0 cites·18 claims
- 2338US10088502B2Test assembly and method of manufacturing the sameSTAR TECH INC·Filed 2016·Granted Oct 2, 2018·0 cites·19 claims
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →