Assignee
SUGIHARA MARI
JP·3 granted patents·13 citations·filing 2007–2011
Top patents by PatentIndex Score
3 records- 0177US8446578B2Defect inspection apparatus, defect inspection method and method of inspecting hole patternSUGIHARA MARI·Filed 2009·Granted May 21, 2013·5 cites·7 claims
- 0276US8199242B2Camera and image processing programSUGIHARA MARI·Filed 2007·Granted Jun 12, 2012·7 cites·22 claims
- 0360US8928768B2Image processing device and computer-readable computer program product containing image processing programSUGIHARA MARI·Filed 2011·Granted Jan 6, 2015·1 cites·12 claims
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