Assignee
SYNTEST TECH INC
US·2 granted patents·3 citations·filing 2015–2016
Top patents by PatentIndex Score
2 records- 0183US9678156B2Multiple-capture DFT method for detecting or locating crossing clock-domain faults during self-test or scan-testSYNTEST TECH INC·Filed 2016·Granted Jun 13, 2017·3 cites·20 claims
- 0253US9696377B2Method and apparatus for broadcasting scan patterns in a scan-based integrated circuitSYNTEST TECH INC·Filed 2015·Granted Jul 4, 2017·0 cites·12 claims
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →