Assignee
Semilab ZRT
HU·0 granted patents·2 pending applications·0 citations·filing 2020–2023
Top patents by PatentIndex Score
2 records- 0145US2025044239A1Method for determining crystal defect concentration lower than 10 ppm in semiconductor materials based on photomodulated reflectance measurementSemilab ZRT·Filed 2023·Application pending·0 cites
- 0223US2020371019A1Rotating-compensator ellipsometerSemilab ZRT·Filed 2020·Application pending·0 cites
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