Assignee
TACHIZAKI TAKEHIRO
JP·2 granted patents·1 pending application·2 citations·filing 2009–2012
Top patents by PatentIndex Score
3 records- 0156US8982332B2Distance measuring device and distance measuring methodTACHIZAKI TAKEHIRO·Filed 2011·Granted Mar 17, 2015·2 cites·8 claims
- 0240US9063168B2Scanning probe microscope and measurement method using sameTACHIZAKI TAKEHIRO·Filed 2012·Granted Jun 23, 2015·0 cites·15 claims
- 0338US2011194101A1Supersensitization of defect inspection methodTACHIZAKI TAKEHIRO·Filed 2009·Application pending·0 cites
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