Assignee
TAKANE ATSUSHI
JP·2 granted patents·1 pending application·48 citations·filing 2007–2009
Top patents by PatentIndex Score
3 records- 0190US8335397B2Charged particle beam apparatusTAKANE ATSUSHI·Filed 2008·Granted Dec 18, 2012·47 cites·7 claims
- 0266US8263935B2Charged particle beam apparatusTAKANE ATSUSHI·Filed 2009·Granted Sep 11, 2012·1 cites·23 claims
- 0357US2007194236A1Semiconductor inspection systemTAKANE ATSUSHI·Filed 2007·Application pending·0 cites
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