Assignee
TAMAI TOSHIYUKI
JP·2 granted patents·6 citations·filing 2010–2010
Top patents by PatentIndex Score
2 records- 0170US8504316B2Form measuring instrument, and calibration method and calibration program thereforTAMAI TOSHIYUKI·Filed 2010·Granted Aug 6, 2013·4 cites·10 claims
- 0264US8290740B2Form measuring instrument, form measuring method, and programTAMAI TOSHIYUKI·Filed 2010·Granted Oct 16, 2012·2 cites·18 claims
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