Assignee
TASHIRO KAZUHIRO
JP·3 granted patents·10 citations·filing 2010–2011
Top patents by PatentIndex Score
3 records- 0184US8797055B2Prober and method of inspecting semiconductor chipTASHIRO KAZUHIRO·Filed 2011·Granted Aug 5, 2014·6 cites·7 claims
- 0279US8268670B2Method of semiconductor device protectionTASHIRO KAZUHIRO·Filed 2011·Granted Sep 18, 2012·4 cites·2 claims
- 0349US8164181B2Semiconductor device packaging structureTASHIRO KAZUHIRO·Filed 2010·Granted Apr 24, 2012·0 cites·2 claims
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