Assignee
TECHINSIGHTS INC
CA16 patents
Top patents by PatentIndex Score
US11214874B2Jan 4, 2022
Method and system for ion beam delayering of a sample and control thereof
TECHINSIGHTS INC2 citations70
US9915628B2Mar 13, 2018
Circuit tracing using a focused ion beam
TECHINSIGHTS INC3 citations68
US11301988B2Apr 12, 2022
Reverse engineering data analysis system, and integrated circuit component data processing tool and method thereof
TECHINSIGHTS INC0 citations62
US10469777B2Nov 5, 2019
Methods, systems and devices relating to distortion correction in imaging devices
TECHINSIGHTS INC1 citations57
US11593545B2Feb 28, 2023
Integrated circuit imaging, rendering and layout editing system and method
TECHINSIGHTS INC0 citations56
US11074389B2Jul 27, 2021
Integrated circuit imaging, rendering and layout editing system and method
TECHINSIGHTS INC0 citations56
US10803577B2Oct 13, 2020
Reverse engineering data analysis system, and integrated circuit component data processing tool and method thereof
TECHINSIGHTS INC0 citations52
US12498417B2Dec 16, 2025
Contrast-enhancing staining system and method and imaging methods and systems related thereto
TECHINSIGHTS INC0 citations50
US10689763B2Jun 23, 2020
Method and system for ion beam delayering of a sample and control thereof
TECHINSIGHTS INC0 citations49
US10550480B2Feb 4, 2020
Method and system for ion beam delayering of a sample and control thereof
TECHINSIGHTS INC0 citations49
US12165840B2Dec 10, 2024
Ion beam delayering system and method, topographically enhanced delayered sample produced thereby, and imaging methods and systems related thereto
TECHINSIGHTS INC0 citations48
US9529040B2Dec 27, 2016
Circuit tracing using a focused ion beam
TECHINSIGHTS INC0 citations48
US10489545B2Nov 26, 2019
Integrated circuit imaging, rendering and layout editing system and method
TECHINSIGHTS INC0 citations46
US9383327B2Jul 5, 2016
Circuit tracing using a focused ion beam
TECHINSIGHTS INC0 citations45
US12176177B2Dec 24, 2024
Ion beam chamber fluid delivery apparatus and method and ion beam etcher using same
TECHINSIGHTS INC0 citations44
US12555241B2Feb 17, 2026
System and method for image segmentation from sparse particle impingement data
TECHINSIGHTS INC0 citations41