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TESEDA CORP
US8 patents
Top patents by PatentIndex Score
US7036062B2Apr 25, 2006
Single board DFT integrated circuit tester
TESEDA CORP23 citations85
US8918753B2Dec 23, 2014
Correlation of device manufacturing defect data with device electrical test data
TESEDA CORP4 citations79
US10768231B2Sep 8, 2020
Diagnosing failing scan chains in a semiconductor integrated circuit
TESEDA CORP2 citations62
US10247777B1Apr 2, 2019
Detecting and locating shoot-through timing failures in a semiconductor integrated circuit
TESEDA CORP2 citations62
US6925406B2Aug 2, 2005
Scan test viewing and analysis tool
TESEDA CORP2 citations54
US6956394B2Oct 18, 2005
Tester architecture for testing semiconductor integrated circuits
TESEDA CORP3 citations52
US8892972B2Nov 18, 2014
Scan chain fault diagnosis
TESEDA CORP0 citations46
US9939488B2Apr 10, 2018
Field triage of EOS failures in semiconductor devices
TESEDA CORP1 citations45