Assignee
TOMIMATSU SATOSHI
JP·3 granted patents·10 citations·filing 2010–2011
Top patents by PatentIndex Score
3 records- 0191US8569719B2Method and apparatus for specimen fabricationTOMIMATSU SATOSHI·Filed 2011·Granted Oct 29, 2013·6 cites·18 claims
- 0286US8405053B2Method and apparatus for specimen fabricationTOMIMATSU SATOSHI·Filed 2011·Granted Mar 26, 2013·4 cites·3 claims
- 0343US8680465B2Charged particle beam apparatus and film thickness measurement methodTOMIMATSU SATOSHI·Filed 2010·Granted Mar 25, 2014·0 cites·26 claims
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